The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 2018
Filed:
Sep. 24, 2015
Applicant:
Electronics and Telecommunications Research Institute, Daejeon, KR;
Inventors:
Sang-Woo Seo, Daejeon, KR;
Myung-Gyu Kim, Daejeon, KR;
Ye-Jin Kim, Daejeon, KR;
Jong-Sung Kim, Daejeon, KR;
Seong-Min Baek, Daejeon, KR;
Il-Kwon Jeong, Daejeon, KR;
Assignee:
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE, Daejeon, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 15/00 (2006.01); H04N 13/02 (2006.01); H04N 17/00 (2006.01);
U.S. Cl.
CPC ...
H04N 13/0282 (2013.01); H04N 13/0242 (2013.01); H04N 13/0246 (2013.01); H04N 17/002 (2013.01);
Abstract
This invention provides a device and a method of multi-view image calibration which can easily acquire calibration parameters (intrinsic/extrinsic parameter) of multi-image input device in wide space without separate calibration tool.