The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2018

Filed:

Oct. 07, 2013
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Makiko Mori, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 9/31 (2006.01);
U.S. Cl.
CPC ...
H04N 9/3185 (2013.01); H04N 9/3147 (2013.01); H04N 9/3182 (2013.01);
Abstract

In a projector which constitutes an image projection system to project one image by combining a plurality of projection images projected by a plurality of projectors on a screen while overlapping parts of the projection images with each other, the projector is provided with a deformation unit configured to carry out geometric deformation with respect to an image to be projected therefrom, and a setting unit configured to set a parameter for deformation processing by the deformation unit, wherein the setting unit sets the parameter for deformation processing based on a relation between a position of an overlap area in the projection image before the deformation by the deformation unit is carried out, and a position of an overlap area in the projection image after the deformation by the deformation unit has been carried out.


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