The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2018

Filed:

Dec. 01, 2016
Applicant:

Xerox Corporation, Norwalk, CT (US);

Inventors:

Douglas R. Taylor, Webster, NY (US);

Eliud Robles Flores, Rochester, NY (US);

Assignee:

Xerox Corporation, Norwalk, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/393 (2006.01); H04N 1/00 (2006.01);
U.S. Cl.
CPC ...
H04N 1/00005 (2013.01); H04N 1/00015 (2013.01); H04N 1/00037 (2013.01); H04N 1/00074 (2013.01); H04N 1/393 (2013.01); H04N 2201/0094 (2013.01);
Abstract

Methods and systems print an original image to form a printed sheet, scan the printed sheet, and overlay the original image on an area of the scanned image where original image is located, to produce an overlay image. A border is added to the original image in the overlay image to modify the original image into an enlarged original image. Markings from an area of the overlay image where the enlarged original image is positioned are removed to produce a white space image. Defects in the white space image are detected and highlighted by adding highlight markings to the white space image where the defects are located, to produce a defect image. The defect image is displayed.


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