The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 2018
Filed:
Jun. 02, 2016
Applicant:
Texas Instruments Incorporated, Dallas, TX (US);
Inventor:
Sidharth Balasubramanian, Garland, TX (US);
Assignee:
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/16 (2015.01); H04B 17/10 (2015.01);
U.S. Cl.
CPC ...
H04B 17/104 (2015.01); H04B 17/16 (2015.01);
Abstract
A system and method for measuring phase variations in signals are disclosed. The system and method may be integrated inside a circuit pack in the form of a built-in-self-test (BIST) unit. The BIST provides predetermined periodic attenuation to an input signal and determines phase variation in output signal due to applied attenuations by measuring sideband power of the output signal.