The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2018

Filed:

Oct. 01, 2015
Applicant:

908 Devices Inc., Boston, MA (US);

Inventors:

Christopher D. Brown, Los Gatos, CA (US);

Evgeny Krylov, Franklin, MA (US);

Michael Goodwin, Brookline, MA (US);

Kerin Gregory, Bolton, MA (US);

Andrew J. Bartfay-Szabo, North Andover, MA (US);

Assignee:

908 Devices Inc., Boston, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); H01J 49/26 (2006.01); H01J 49/02 (2006.01); H01J 49/42 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0095 (2013.01); H01J 49/0036 (2013.01); H01J 49/022 (2013.01); H01J 49/025 (2013.01); H01J 49/427 (2013.01);
Abstract

The disclosure features mass spectrometry systems and methods that include an ion source, an ion trap, a detector subsystem featuring first and second detector elements, and a controller electrically connected to the ion source, the ion trap, and the detector subsystem and configured so that during operation of the system, the controller: applies an electrical signal to the ion source to generate positively and negatively charged particles from sample particles in the system; applies an electrical signal to the ion trap to eject a plurality of particles from the ion trap through a common aperture of the ion trap, and determines information about the sample particles based on first and second electrical signals generated by the ejected particles.


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