The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2018

Filed:

Mar. 24, 2015
Applicant:

Pixar, Emeryville, CA (US);

Inventors:

Christophe Hery, San Rafael, CA (US);

Leonid Pekelis, San Bruno, CA (US);

Assignee:

Pixar, Emeryville, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 15/50 (2011.01); G06T 15/06 (2011.01); G06T 15/00 (2011.01); G06T 13/20 (2011.01);
U.S. Cl.
CPC ...
G06T 15/506 (2013.01); G06T 13/20 (2013.01); G06T 15/005 (2013.01); G06T 15/06 (2013.01);
Abstract

Systems, devices, and methods are provided for rendering images of hair using a statistical light scattering model for hair that approximates ground truth physical models. The model is significantly faster than other implementations of the Marschner hair model. The statistical light scattering model includes all the features of Marschner such as eccentricity for elliptical cross-sections, and extends them by adding azimuthal roughness control, consideration of natural fiber torsion, and full energy preserving. Adaptive Importance Sampling (AIS) is specialized to fit easily sampled distributions to bidirectional curve scattering density functions (BCSDFs) of the model.


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