The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2018

Filed:

Apr. 08, 2016
Applicant:

Wistron Corporation, New Taipei, TW;

Inventors:

Sheng-Shien Hsieh, New Taipei, TW;

Kai-Chung Cheng, New Taipei, TW;

Yu-Wen Huang, New Taipei, TW;

Tzu-Yao Lin, New Taipei, TW;

Pin-Hong Liou, New Taipei, TW;

Assignee:

Wistron Corporation, New Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/593 (2017.01);
U.S. Cl.
CPC ...
G06T 7/593 (2017.01); G06T 7/0022 (2013.01); G06T 7/0075 (2013.01); G06T 2207/10012 (2013.01); G06T 2207/20228 (2013.01);
Abstract

A depth image processing method and a depth image processing system are provided. The depth image processing method includes: capturing a first image and a second image; performing a feature comparison to acquire a plurality of feature pairs between the first image and the second image, wherein each of the feature pairs includes a feature in the first image and a corresponding feature in the second image; computing disparities of the feature pairs; computing a depth image through the first image and the second image when the disparities of the feature pairs are all smaller than a disparity threshold.


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