The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2018

Filed:

Dec. 16, 2016
Applicant:

Patternex, Inc., San Jose, CA (US);

Inventors:

Uday Veeramachaneni, San Jose, CA (US);

Vamsi Korrapati, San Jose, CA (US);

Constantinos Bassias, San Jose, CA (US);

Ignacio Arnaldo, San Jose, CA (US);

Ke Li, San Jose, CA (US);

Assignee:

Patternex, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/00 (2013.01); G06N 99/00 (2010.01); G06F 21/56 (2013.01);
U.S. Cl.
CPC ...
G06N 99/005 (2013.01); G06F 21/56 (2013.01);
Abstract

Disclosed herein are a method and system for training a big data machine to defend, retrieve log lines belonging to log line parameters of a system's data source and from incoming data traffic, compute features from the log lines, apply an adaptive rules model with identified threat labels produce a features matrix, identify statistical outliers from execution of statistical outlier detection methods, and may generate an outlier scores matrix. Embodiments may combine a top scores model and a probability model to create a single top scores vector. The single top scores vector and the adaptive rules model may be displayed on a GUI for labeling of malicious or non-malicious scores. Labeled output may be transformed into a labeled features matrix to create a supervised learning module for detecting new threats in real time and reducing the time elapsed between threat detection of the enterprise or e-commerce system.


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