The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2018

Filed:

Dec. 03, 2015
Applicant:

Brightway Vision, Ltd., Haifa, IL;

Inventor:

Yoav Grauer, Haifa, IL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); G06K 9/00 (2006.01); G06K 9/46 (2006.01); H04N 5/232 (2006.01); G06K 9/62 (2006.01); G01S 17/89 (2006.01); G01S 17/93 (2006.01); G01S 17/10 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00805 (2013.01); G01S 17/107 (2013.01); G01S 17/89 (2013.01); G01S 17/936 (2013.01); G06K 9/4661 (2013.01); G06K 9/6293 (2013.01); H04N 5/23216 (2013.01);
Abstract

Imaging system and method, the system including a main detection unit, an auxiliary detection unit, an image processor, and a controller. The main detection unit includes a light source that emits light pulses and a gated image sensor that receives reflections of the light pulses reflected from a selected depth of field in the environment and converts the reflections into a reflection-based image. The auxiliary detection unit includes a thermal sensor that detects infrared radiation emitted from the environment and generates an emission-based image. The image processor processes and detects at least one region of interest in the acquired reflection-based image and/or acquired emission-based image. The controller adaptively controls at least one detection characteristic of a detection unit based on information obtained from the other detection unit. The image processor detects at least one object of interest in the acquired reflection-based image and/or acquired emission-based image.


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