The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 2018
Filed:
Dec. 19, 2013
Koninklijke Philips N.v., Eindhoven, NL;
Martin Christian Valvik, Hillerod, DK;
Niels Agersnap Larsen, Niva, DK;
Tommy Winther Berg, Kopenhagen, DK;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
A particle classifier system and a method of training the system are described. The particle classifier system is suitable for classification of particles in a liquid sample, said particle classifier system comprises—an optical detection assembly comprising at least one image acquisition device with an optical axis, the image acquisition device is configured to acquire images of an image acquisition area perpendicular to said optical axis; —a sample device comprising at least one sample container suitable for holding a sample in liquid form; —a translating arrangement configured to translate said image acquisition area through at least a part of said sample container; —a control system configured to controlling said optical detection assembly and said translating unit to acquire images of a plurality of image acquisition areas; —an image analyzing processing system programmed to analyze said acquired images by a method comprising creating objects (sub-images) of individual particles captured by said acquired images, creating stacks of objects of each individual particle, identifying complete stacks of objects comprising at least one object wherein said particle is in-focus, and two objects wherein said particle is out-of-focus, and determining, for each of said complete stacks of objects, a set of values for a set of features of at least N features, wherein N is larger than or equal to 1, and wherein the determination of said values of said set of features involve data obtained from said at least one object wherein said particle is in-focus, and/or said at least two objects wherein said particle is out-of-focus; and —an artificial intelligent processing system programmed to associate said set of values for said determined set of features for each individual particle to a particle classification.