The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 2018
Filed:
Nov. 10, 2016
Powerchip Technology Corporation, Hsinchu, TW;
Powerchip Technology Corporation, Hsinchu, TW;
Abstract
A nonparametric method for measuring a clustered level of time rank in binary data is provided. A sample set of engineering data is classified into a target group and a reference group, and a rank is set to each sample in a chronological order. A minimum rank and a maximum rank are obtained from the target group, by which a characteristic period is defined. In the characteristic period, an average rank values of the target group and an average rank value of the reference group are calculated. After creating a dummy sample set, the dummy sample set is incorporated into an analysis data set and a new rank is set based on a comparison result of the average rank value of the target group and the average rank value of the reference group, and the minimum rank and the maximum rank of the characteristic period to obtain adjusted test data. A Mann-Whitney U test is executed on the adjusted test data to obtain a clustered level index of time rank in binary data.