The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 2018
Filed:
Jul. 08, 2015
Applicant:
Futurewei Technologies, Inc., Plano, TX (US);
Inventors:
Chukwuchebem Chinemelum Orakwue, San Diego, CA (US);
Tongzeng Yang, San Diego, CA (US);
Assignee:
Futurewei Technologies, Inc., Plano, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/34 (2006.01); G06F 1/24 (2006.01); G06F 11/30 (2006.01); G06F 9/445 (2006.01); G06F 1/20 (2006.01); G06F 1/32 (2006.01); H04W 52/02 (2009.01); H02M 3/156 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3409 (2013.01); G06F 1/24 (2013.01); G06F 9/44505 (2013.01); G06F 11/3024 (2013.01); G06F 1/206 (2013.01); G06F 1/3212 (2013.01); H02M 3/156 (2013.01); H04W 52/029 (2013.01); Y02B 60/1292 (2013.01); Y02B 60/142 (2013.01); Y02B 60/144 (2013.01); Y02B 60/50 (2013.01);
Abstract
A system and method for dynamic voltage and frequency scaling for processors based on end-user experience metrics is disclosed. In an embodiment, a method in a data processing system for controlling a processor includes monitoring at least one end-user experience metric; obtaining at least one device policy, the device policy specifying a device constraint or measurable device condition; and adjusting at least one operating point for a processor according to at least one end-user experience metric and at least one device policy.