The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2018

Filed:

Nov. 18, 2014
Applicant:

Actifio, Inc., Waltham, MA (US);

Inventors:

Madhav Mutalik, Southborough, MA (US);

Philip J. Abercrombie, Belmont, MA (US);

Christopher A. Provenzano, Somerville, MA (US);

Uday Tekade, Westford, MA (US);

Assignee:

Actifio, Inc., Waltham, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/14 (2006.01); H04L 29/08 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1451 (2013.01); G06F 11/1435 (2013.01); G06F 11/1446 (2013.01); G06F 11/1461 (2013.01); G06F 11/1464 (2013.01); G06F 17/302 (2013.01); H04L 67/10 (2013.01); G06F 11/1453 (2013.01); G06F 11/1456 (2013.01); G06F 2201/84 (2013.01); H04L 67/1097 (2013.01);
Abstract

Systems and methods for checking data integrity of a data object copied between storage pools in a storage system by comparing data samples copied from data objects. A series of successive copy operations are scheduled over time for copying a data object from a source data store to a target data store. A first data sample is generated based on a sampling scheme comprising an offset and a period. A second data sample is generated using a similar sampling scheme. The blocks of data in the first data sample and the second data sample are compared to determine if they differ to thereby indicate that the data object at the target store differs from the corresponding data object at the source data store.


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