The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2018

Filed:

May. 30, 2017
Applicant:

Renesas Electronics Corporation, Tokyo, JP;

Inventors:

Yoshiyuki Amanuma, Tokyo, JP;

Takanori Miyoshi, Tokyo, JP;

Assignee:

RENESAS ELECTRONICS CORPORATION, Kawasaki-Shi, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01); G06F 21/60 (2013.01); G06F 21/64 (2013.01); G06F 21/71 (2013.01); G06F 21/75 (2013.01); G06F 21/81 (2013.01); H03K 19/003 (2006.01);
U.S. Cl.
CPC ...
G06F 11/10 (2013.01); G06F 21/604 (2013.01); G06F 21/64 (2013.01); G06F 21/71 (2013.01); G06F 21/75 (2013.01); G06F 21/81 (2013.01); H03K 19/003 (2013.01);
Abstract

A semiconductor integrated circuit includes a logic circuit including a plurality of storage elements which can each store 1-bit information and an attack detection circuit, the attack detection circuit includes an error determination circuit which can detect through a logic operation that errors have occurred in codes stored in said a plurality of storage elements, and a light irradiation detection circuit which has a light detection element and can detect light irradiation, a light detection element is disposed in the center of area for detecting light irradiation surrounding a plurality of storage elements. It is determined that the logic circuit has been attacked from outside when the error determination circuit detects an error or the light irradiation detection circuit detects light irradiation.


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