The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2018

Filed:

Oct. 07, 2014
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventor:

Sandun Shivantha Kuruppu, Dallas, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/34 (2006.01);
U.S. Cl.
CPC ...
G01R 31/343 (2013.01);
Abstract

A system includes a proportional-integrated-derivative (PID) regulator. The system also includes a fault detection unit. The fault detection unit is for receiving at least two outputs from the PID regulator. The at least two outputs include at least two rotor reference frame (D-Q) currents. The fault detection unit is further for generating a detection signal based on the at least two rotor reference frame currents. The detection signal identifies a fault based on the fault detection signal amplitude value based on the magnitudes of the amplitudes for each of the at least two rotor reference frame D-Q currents. The fault detection unit is for identifying an existence of a permanent magnet motor fault based on a comparison between the fault detection signal amplitude value and an amplitude threshold value. Further the fault localization signature is utilized to locate the location of the fault.


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Kuruppu, Sandun. (2018). Method and circuitry for detecting faults in field oriented controlled permanent magnet synchronous machines (U.S. Patent No. 9903917). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9903917

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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