The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2018

Filed:

Apr. 05, 2010
Applicant:

Kazuhiro Ohmiya, Kyoto, JP;

Inventor:

Kazuhiro Ohmiya, Kyoto, JP;

Assignee:

Arkray, Inc., Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/558 (2006.01);
U.S. Cl.
CPC ...
G01N 33/558 (2013.01);
Abstract

Provided is an analysis method in which increase in a background can be prevented in a simple manner without cost. The analysis method of the present invention is carried out using a sample analysis toolincluding a development memberin which a developing solution supply portion, a sample supply portion, and a detection portionin which a substancethat specifically binds to an analytein a sample is immobilized are provided in this order from upstream to downstream along the flow of a developing solution. A sample solution is supplied to the sample supply portion, and a developing solution is supplied to the developing solution supply portionsimultaneously with the supply of the sample solution or prior to the supply of the sample solution. By the development of the developing solution in the development memberin the presence of a labeled specifically binding substance, the sample solution is introduced to the detection portion. In the detection portion, a complexof the immobilized specifically binding substance, the analyte, and the labeled specifically binding substanceis formed. The analyteis analyzed by detecting a labelin the complex


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