The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 2018
Filed:
Jul. 22, 2015
Ortho-clinical Diagnostics, Inc., Raritan, NJ (US);
Theodore J. DiMagno, Penfield, NY (US);
Joseph J. Dambra, Rochester, NY (US);
Randy K. Bower, Pittsford, NY (US);
Ortho-Clinical Diagnostics, Inc., Raritan, NJ (US);
Abstract
An assay device includes a support, test elements arranged thereover, and a diverter defining a common sample addition area of the device. The diverter conducts respective portions of a fluidic sample from the area to each of the test elements. Another assay device includes the test elements, one a dry slide element, disposed over the support at least partly in proximity to each other to define a common sample addition area. Apparatus for analyzing a sample includes an assay device having the test elements, one a dry slide element. A controller operates a metering mechanism, to apply the sample to the assay device, an incubator, and a measurement device per a timing protocol to determine a characteristic of the sample. Methods for enabling an assay device to perform multiple tests based upon a single sample metering event include are also described.