The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 2018
Filed:
Dec. 30, 2008
Applicants:
John T. Wong, Bridgeport, CT (US);
Dan Ursenbach, Hamden, CT (US);
Inventors:
John T. Wong, Bridgeport, CT (US);
Dan Ursenbach, Hamden, CT (US);
Assignee:
Sikorsky Aircraft Corporation, Stratford, CT (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/20 (2006.01); G01N 29/265 (2006.01); G01N 29/44 (2006.01);
U.S. Cl.
CPC ...
G01N 33/20 (2013.01); G01N 29/265 (2013.01); G01N 29/4427 (2013.01); G01N 29/4445 (2013.01); G01N 2291/0231 (2013.01); G01N 2291/0234 (2013.01); G01N 2291/2694 (2013.01);
Abstract
A method of non-destructive inspection evaluation includes converting a scan file of a part into a text file, determining whether the signal attenuation representative value is greater than a predetermined value and outputting a numeric score related to the signal attenuation representative value to signify a defect.