The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 2018
Filed:
Apr. 29, 2015
Applicant:
Areva NP, Courbevoie, FR;
Inventors:
Yannick Caulier, Chalon sur Saone, FR;
Matthieu Taglione, Dijon, FR;
Assignee:
AREVA NP, Courbevoie, FR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01N 25/72 (2006.01); G01J 5/10 (2006.01); G06T 7/00 (2017.01); G01J 5/00 (2006.01);
U.S. Cl.
CPC ...
G01N 25/72 (2013.01); G01J 5/10 (2013.01); G06T 7/0004 (2013.01); G01J 2005/0077 (2013.01); G06T 2207/10004 (2013.01);
Abstract
A photothermal examination method and corresponding examination unit are provided. In the method first and second zones of the surface to be characterized are scanned simultaneously, and first and second photosensitive surfaces separate from one another acquire images of the infrared radiation emitted by these two zones.
Caulier, Yannick. (2018). Photothermal examination method and corresponding examination unit (U.S. Patent No. 9903828). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9903828
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile