The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 2018
Filed:
Jun. 14, 2016
Applicant:
California Institute of Technology, Pasadena, CA (US);
Inventors:
Chun-Jen Hsueh, Pasadena, CA (US);
Kaushik Bhattacharya, La Canada, CA (US);
Guruswami Ravichandran, Arcadia, CA (US);
Md Z. Hossain, Pasadena, CA (US);
Assignee:
CALIFORNIA INSTITUTE OF TECHNOLOGY, Pasadena, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01N 3/08 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G01N 3/08 (2013.01); G06T 7/0002 (2013.01); G01N 2203/0066 (2013.01); G01N 2203/0218 (2013.01); G01N 2203/0647 (2013.01); G06T 2207/30164 (2013.01);
Abstract
Methods for measuring the effective fracture toughness in a material are described. A rail and roller system are used to apply a gradual force to a specimen. The time-dependent force creates a steady fracture development that allows a camera to record the progressive fracture in the material. Mathematical methods can then be used to analyze the fracture progression and determine the effective fracture toughness.