The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 2018
Filed:
Sep. 26, 2012
Leica Geosystems Ag, Heerbrugg, CH;
Norbert Kotzur, Alstätten, CH;
Jürgen Mayer, Widnau, CH;
LEICA GEOSYSTEMS AG, Heerbrugg, CH;
Abstract
A measuring system for marking a known target point in a coordinate system includes a mobile marking unit and a geodetic measuring device. The measuring device has a sighting unit, angle measurement functionality, and a camera for capturing a camera image. The measuring system has a database storing a target point position, an output unit that presents the camera image, and a control and processing unit. The measuring system has presentation functionality that presents a spatial deviation between the marking unit and target point positions on the output unit in first and second directions using, respectively, using first and second deviation displays. The first deviation display indicates a distance of the target point position from a plane defined by the measuring device and the marking unit. The second deviation display indicates a distance of the target point position from a normal to the plane defined by the marking unit position.