The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2018

Filed:

Aug. 01, 2014
Applicant:

Hysitron, Inc., Eden Prairie, MN (US);

Inventors:

Rajiv Dama, Chanhassen, MN (US);

Svetlana Zigelman, Minnetonka, MN (US);

Assignee:

Hysitron, Inc., Eden Prairie, MN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 21/00 (2006.01); B23P 19/04 (2006.01); G01N 3/42 (2006.01); G01Q 60/36 (2010.01); G01Q 70/02 (2010.01); B23P 19/10 (2006.01); G01D 18/00 (2006.01); G01N 19/04 (2006.01);
U.S. Cl.
CPC ...
B23P 19/04 (2013.01); G01N 3/42 (2013.01); G01Q 60/366 (2013.01); G01Q 70/02 (2013.01); B23P 19/10 (2013.01); G01D 18/00 (2013.01); G01N 19/04 (2013.01); G01N 2203/0078 (2013.01); G01N 2203/0202 (2013.01); G01N 2203/0206 (2013.01); G01N 2203/0286 (2013.01);
Abstract

An instrument changing assembly includes a magazine having one or more probe assembly stations. The assembly further includes at least one probe change tool including a receptacle socket. One or more probe assemblies are retained within the one or more probe assembly stations. The one or more probe assemblies each include a probe receptacle including a probe retention recess and a common socket fitting configured for complementary fitting with a common receptacle socket. The probe change tool is configured to install or extract the respective probes from a mechanical testing instrument according to the complementary fit between the common socket fitting and the common receptacle socket of the probe assemblies. Alternatively, the instrument changing assembly includes an instrument array housing including a plurality of instruments. Each of the one or more instruments (probe and transducer combination) are deployed relative to the instrument array housing with an instrument deployment actuator.


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