The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 2018
Filed:
Aug. 14, 2006
Kenji Ikushima, Kawasaki, JP;
Susumu Komiyama, Setagaya-ku, JP;
Kenji Ikushima, Kawasaki, JP;
Susumu Komiyama, Setagaya-ku, JP;
JAPAN SCIENCE AND TECHNOLOGY AGENCY, Saitama, JP;
Abstract
A measuring method and apparatus in which a measurable object () is irradiated with acoustic waves to measure a change in property value of charged particles in the object from electromagnetic waves induced thereby. A part () of the measurable object irradiated with an acoustic focused beam () is in a charge distribution state in which positive charged particles () are greater in number in the part () where electromagnetic waves induced by positive charged particles () are not canceled by those induced by negative charged particles () and where net electromagnetic waves () are induced. Since a change in concentration of positive charged particles () and/or negative charged particles () changes the intensity of electromagnetic waves (), it is possible to know such a change in concentration of the charged particles from a change in intensity of electromagnetic waves ().