The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2018
Filed:
Mar. 03, 2017
Futurewei Technologies, Inc., Plano, TX (US);
Arkady Molev Shteiman, Basking Ridge, NJ (US);
Xiao-Feng Qi, Westfield, NJ (US);
Futurewei Technologies, Inc., Plano, TX (US);
Abstract
A method, system, and computer-readable medium are provided for calibrating elements of a MIMO array. The method includes the steps of receiving samples of a signal from a plurality of antenna units included in the MIMO array, generating an antenna domain channel estimate based on the samples of the signal received from each antenna unit, estimating a set of spatial parameters based on the antenna domain channel estimate, generating a reconstructed channel based on the estimated set of spatial parameters, comparing the antenna domain channel estimate and the reconstructed channel to determine errors associated with a set of mismatch parameters for each antenna unit, and adjusting the set of mismatch parameters based on the errors. Each antenna unit in the plurality of antenna units is configured to sample the signal based on a clock corresponding with the antenna unit.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile