The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 2018

Filed:

Feb. 09, 2015
Applicant:

Shenzhen China Star Optoelectronics Technology Co., Ltd., Shenzhen, Guangdong, CN;

Inventor:

Jinming Li, Guangdong, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 33/00 (2010.01); G06F 9/45 (2006.01); H01L 29/786 (2006.01); H01L 21/02 (2006.01); H01L 21/306 (2006.01); H01L 27/32 (2006.01); H01L 29/06 (2006.01); H01L 29/66 (2006.01);
U.S. Cl.
CPC ...
H01L 29/78675 (2013.01); H01L 21/02532 (2013.01); H01L 21/02592 (2013.01); H01L 21/02667 (2013.01); H01L 21/30604 (2013.01); H01L 27/3272 (2013.01); H01L 29/0684 (2013.01); H01L 29/66757 (2013.01); H01L 29/786 (2013.01); H01L 2227/323 (2013.01);
Abstract

The present invention provides a low temperature poly-silicon thin-film transistor, as well as a manufacturing method thereof, which includes: a substrate (), a light shield layer () formed on the substrate (), a pad layer () formed on the light shield layer (), a dielectric layer () formed on the pad layer, an active layer () formed on the dielectric layer, a gate insulation layer () formed on the active layer (), and a gate layer () formed on the gate insulation layer (). The light shield layer () includes a planar section () formed on the substrate () and a raised section () formed on the planar section (). The active layer () has a projection that covers at least a partial area of an upper surface of the raised section () and one of sidewalls () of the raised section (). Without varying an aperture ratio of a display device, the channel width can be effectively increased and the width-to-length ratio can be increased so as to increase an open state current and enhance driving power of the LTPS TFT and device performance.


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