The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2018
Filed:
Feb. 18, 2016
Texas Instruments Incorporated, Dallas, TX (US);
Kenneth Michael Butler, Richardson, TX (US);
Kalyan Chakravarthy Cherukuri, Allen, TX (US);
Stephanie Watts Butler, Richardson, TX (US);
Venkataramanan Kalyanaraman, Dallas, TX (US);
Hubert Joseph Payne, Parker, TX (US);
Yazdi Dinshaw Contractor, Tucson, AZ (US);
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Abstract
Systems and methods for visual identification of semiconductor dies are described. In some embodiments, a method may include: receiving a semiconductor wafer having a plurality of dies and printing a unique visual identification mark on each of the plurality of dies. In other embodiments, a method may include receiving an electronic device comprising a die and a package surrounding at least a portion of the die and reading, from the electronic device, a unique visual identification mark that encodes a Cartesian coordinate of the die relative to a reference point on a semiconductor wafer.