The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2018
Filed:
Oct. 20, 2014
Heye International Gmbh, Obernkirchen, DE;
Hartwin Stüwe, Hespe, DE;
HEYE INTERNATIONAL GMBH, Obernkirchen, DE;
Abstract
The invention relates to a method for detecting defects in the walls of hollow glass items that rotate about their longitudinal axis during inspection, which method, in one form, is characterized by the production of an image series () that is binarised using a grey-scale value threshold image (), wherein the threshold values of the threshold image () are measured differently according to the fixed positions of radiation-receiving elements used to display images. The images of the image series () formed by binarising the original image series () are combined in a histogram () that locally adds up the frequency of an occurrence of, inter alia, defect pixels representing static reflections within the sensor regions of the image series (). Based on this histogram (), a two-dimensional fade-out mask () is formed on which the regions of static reflections are combined, and by means of which the sensor regions () of the original image series () are masked, such that a masked image series () is produced, said series having images, in particular sensor regions characterized in that static reflections are faded out on same, whereby a subsequent flaw-detecting evaluation () of the images can be carried out, independent of their sequence.