The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2018
Filed:
Feb. 04, 2016
National Chiao Tung University, Hsinchu, TW;
Shiuhpyng Shieh, Hsinchu, TW;
Chi-Wei Wang, Hsinchu, TW;
Chia-Wei Wang, Hsinchu, TW;
Chia-Wei Hsu, Hsinchu, TW;
NATIONAL CHIAO TUNG UNIVERSITY, Hsinchu, TW;
Abstract
An automatic probe construction system and the method thereof are provided. The automatic probe construction system includes a data dereference analysis module, a probe selection module, and a probe verification module. The data dereference analysis module dereferences a plurality of target data of an electronic apparatus according to a plurality of pointers, and constructs a plurality of candidate probes. The probe selection module constructs a control flow graph according to the candidate probes and an instruction code of an executable image file, to select via the control flow graph from the candidate probes at least one dedicated probe. The probe verification module searches the executable image file for an instruction code corresponding to the dedicated probe, to verify the dedicated probe. Therefore, the dedicated probe can be constructed automatically, and the number of the dedicated probes is thus limited.