The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 2018

Filed:

Dec. 02, 2014
Applicant:

Thales, Courbevoie, FR;

Inventors:

Sébastien Laux, Palaiseau, FR;

Paul Jougla, Paris, FR;

François Lureau, Paris, FR;

Assignee:

THALES, Courbevoie, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 27/10 (2006.01); H01S 3/00 (2006.01); G01J 1/42 (2006.01); G01J 1/04 (2006.01); G02B 17/00 (2006.01); G02B 27/09 (2006.01);
U.S. Cl.
CPC ...
G02B 27/108 (2013.01); G01J 1/0414 (2013.01); G01J 1/4257 (2013.01); G02B 17/008 (2013.01); G02B 27/0988 (2013.01); H01S 3/0057 (2013.01); H01S 3/0071 (2013.01); G01J 2001/4238 (2013.01);
Abstract

A device for the sampling of a pulsed laser beam of high energy, typically greater than 1 J, and of large size, having a diameter typically greater than 1 cm, combined with a compressor, comprises, upstream of the compressor: a sample-taking device provided with a sampling diopter capable of transmitting T % of the pulsed laser beam, T being greater than 90, and of reflecting (1−T) % of the pulsed laser beam, the reflected beam being called sampled beam, an afocal capable of reducing the size of the sampled beam, the compressor having a determined useful aperture, a device for reinjecting the reduced sampled beam into this useful aperture.


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