The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2018
Filed:
Mar. 28, 2014
Marc Holland, Mainz, DE;
Wouter E. Van Der Zee, Voorburg, NL;
Marc Holland, Mainz, DE;
Wouter E. Van Der Zee, Voorburg, NL;
BAKER HUGHES, A GE COMPANY, LLC, Houston, TX (US);
Abstract
A method and computer-readable medium for establishing an uncertainty for obtained values of a one-dimensional logging parameter mapped to a three-dimensional volume is disclosed. A relation is formed between the obtained values of the logging parameter and a volumetric parameter of the three-dimensional volume. A set of representative data points is obtained that relates the obtained values of the logging parameter to the volumetric parameter by binning the obtained values. A plurality of regression curves are then determined, wherein each regression curve is obtained by adding a random error to the set of representative data points to obtain a set of randomized data points and performing a regression analysis using the set of randomized data points. The plurality of regression curves are used to establish the uncertainty for the values of the logging parameter in the three-dimensional volume.