The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 2018

Filed:

Nov. 07, 2014
Applicant:

Toshiba Medical Systems Corporation, Otawara-shi, JP;

Inventors:

Chunguang Cao, Buffalo Grove, IL (US);

Yu Zou, Naperville, IL (US);

Xiaolan Wang, Buffalo Grove, IL (US);

Miesher L. Rodrigues, Buffalo Grove, IL (US);

Yuexing Zhang, Naperville, IL (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 18/00 (2006.01); G01T 1/24 (2006.01); A61B 6/00 (2006.01); A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
G01T 1/247 (2013.01); A61B 6/032 (2013.01); A61B 6/4241 (2013.01); A61B 6/4266 (2013.01); A61B 6/5205 (2013.01);
Abstract

An apparatus and a method are provided for calculating an output spectrum of a photon-counting detector based on an incident spectrum. The apparatus includes processing circuitry to determine a plane extending from a top face of the photon-counting detector that includes regions that all possible incident rays will transverse; divide the determined plane into subregions; calculate a detector response function for each of the subregions; determine an overall detector response function by summing the calculated detector response function for each of the subregions and normalizing the summation by an area of the determined plane; and calculate the output spectrum based on the overall detector response function and the incident spectrum.


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