The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 2018

Filed:

Feb. 05, 2015
Applicant:

Gerhard Brinker, Erlangen, DE;

Inventor:

Gerhard Brinker, Erlangen, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); G01R 33/58 (2006.01); G01R 33/36 (2006.01);
U.S. Cl.
CPC ...
G01R 33/58 (2013.01); G01R 33/36 (2013.01); G01R 33/583 (2013.01);
Abstract

A predetermined reference object is arranged in a scan volume of a magnetic resonance system. In the scope of adjustment measurements, the reference object is respectively exposed by a radiofrequency transmitter antenna to an adjustment pulse. Using at least one radiofrequency receiver antenna, a magnetic resonance signal excited by the respective adjustment pulse in the reference object is respectively recorded. An amplitude of a first test pulse is ascertained with the aid of the magnetic resonance signals recorded in the scope of the adjustment measurements. In the scope of a subsequent test measurement, the reference object is exposed to the first test pulse by the radiofrequency transmitter antenna. A first measurement signal dependent on the amplitude of the first test pulse is recorded during the exposure of the reference object to the first test pulse. Further measures are implemented based on the recorded first measurement signal.


Find Patent Forward Citations

Loading…