The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 2018

Filed:

Oct. 07, 2015
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Hui Peng Jia, Shanghai, CN;

Chunfeng Yang, Shanghai, CN;

Bin Li, Shenzhen, CN;

Assignee:

DELL PRODUCTS L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G11C 29/56 (2006.01); G01R 1/04 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2808 (2013.01); G11C 29/56016 (2013.01); G01R 1/0408 (2013.01);
Abstract

A system and a method for testing information handling systems is provided. The system includes a top cover having a memory circuit and a bottom platform for receiving a test printed circuit board assembly (PCBA) including a slot. The system includes a sensor determining the relative position of the memory circuit and the slot; and a host controller coupled to the test PCBA and the sensor through a port. A computer program product including a non-transitory computer readable medium having computer readable and executable code is also provided. The code instructs a processor in a host controller in a test fixture to load a memory circuit on a crane; engage a sub-module carrying the memory circuit; load a printed circuit board assembly (PCBA); place a memory device on a slot in the PCBA; perform a system test on the PCBA; disengage the sub-module and the test fixture.


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