The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2018
Filed:
Jun. 01, 2015
Siemens Aktiengesellschaft, Munich, DE;
Wei Gang Chen, Shanghai, CN;
Feng Du, Shanghai, CN;
Sebastian Haas, Weigendorf/Hoegen, DE;
Yue Zhuo, Beijing, CN;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
A fault arc detection method includes: sampling an instantaneous current value of a circuit; using the instantaneous current value to predict a current peak value and, when the predicted current peak value is greater than a predetermined threshold, determining that a first energy fault arc is to appear; and comparing a time domain or frequency domain feature of the instantaneous current value with a reference time domain feature or a reference frequency domain feature of the current of a fault arc of the circuit. When the similarity between the time domain or frequency domain feature and the reference time or reference frequency domain feature of the current of the fault arc reaches a predetermined range, a second energy fault arc is determined to appear. The method and detection device detect the occurrence of a fault arc early and they are able to distinguish different types of fault arcs.