The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2018
Filed:
Feb. 12, 2010
Kanako Iwamura, Otawara, JP;
Shoichi Kanayama, Otawara, JP;
Nobuyasu Kobayashi, Otawara, JP;
Toshiba Medical Systems Corporation, Otawara-shi, JP;
Abstract
Disclosed is an automatic analyzer that analyzes a component of a target layer of a test sample separated into a plurality of layers by transferring the component from an installed container, including: a dispensing probe that descends into the target layer and suctions the component; a detecting unit that detects the height of the layer surface of the target layer of the test sample; a calculating unit that calculates the depth from the layer surface of the target layer at which the total content of the component of the target layer reaches a target amount; and a controller that causes the dispensing probe to descend to the depth calculated by the calculating unit and suction the component.