The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2018
Filed:
Jul. 31, 2015
Applicant:
Toshiba Medical Systems Corporation, Otawara-shi, JP;
Inventors:
Assignee:
Toshiba Medical Systems Corporation, Otawara-shi, JP;
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/543 (2006.01); G01N 21/77 (2006.01); G01N 21/82 (2006.01); G01N 21/552 (2014.01); G01N 21/17 (2006.01); G01N 21/75 (2006.01); G01N 21/27 (2006.01);
U.S. Cl.
CPC ...
G01N 33/54373 (2013.01); G01N 21/7703 (2013.01); G01N 21/82 (2013.01); G01N 21/272 (2013.01); G01N 21/552 (2013.01); G01N 2021/1727 (2013.01); G01N 2021/1731 (2013.01); G01N 2021/757 (2013.01);
Abstract
According to one embodiment, a specimen measurement apparatus includes a detector and a control circuit, and is configured to perform a plurality of steps to measure the properties of a test substance retained in a reaction container. The detector outputs electromagnetic waves to the reaction container and detects the electromagnetic waves that vary according to the state in the reaction container. The control circuit controls transition timing between steps of the plurality of steps based on the detection result of the electromagnetic waves obtained by the detector.