The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 2018

Filed:

Dec. 15, 2014
Applicant:

Raytheon Company, Waltham, MA (US);

Inventors:

Dylan W. R. Martin, Tucson, AZ (US);

Edmundo M. Samaniego, Tucson, AZ (US);

John O. Crawford, Vail, AZ (US);

Emmanuel J. Simeus, Tucson, AZ (US);

James E. Faoro, Tucson, AZ (US);

Assignee:

Raytheon Company, Waltham, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/223 (2006.01); G06K 9/00 (2006.01); H01L 23/544 (2006.01);
U.S. Cl.
CPC ...
G01N 23/223 (2013.01); G06K 9/00577 (2013.01); H01L 23/544 (2013.01); H01L 2223/54406 (2013.01); H01L 2223/54433 (2013.01); H01L 2223/54473 (2013.01); H01L 2924/0002 (2013.01);
Abstract

A method includes selecting one or more analysis algorithms to be used to verify an authenticity of an electronic component. Each analysis algorithm identifies a type of data to be analyzed and/or a manner in which the data is to be collected. Each analysis algorithm also defines how the data is to be analyzed to verify the authenticity of the electronic component. The method also includes obtaining data associated with the electronic component. The method further includes analyzing the data associated with the electronic component using the one or more selected analysis algorithms to determine whether the electronic component is authentic. In addition, the method includes generating an output based on the analysis. One or more characteristics of the electronic component could be compared against one or more characteristics of at least one reference component, or variations in one or more characteristics of multiple electronic components could be identified.


Find Patent Forward Citations

Loading…