The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2018
Filed:
Jan. 06, 2014
University of Limerick, Limerick, IE;
Laserspec, Malonne, BE;
Christophe Silien, Limerick, IE;
Ning Liu, Limerick, IE;
Andre Peremans, Malonne, BE;
David Symens, Maizeret, BE;
Syed A. M. Tofail, Limerick, IE;
University of Limerick, Limerick, IE;
Abstract
The invention provides a method and system to record the absorption of a sample, said method comprising the steps of providing first and second pulsed beam of light on said sample using one or more light beams, said first and second pulsed beam having different spatial definition; measuring the difference in intensity transmitted through and/or reflected by a sample; and generating an image by scanning the sample while making such measurements. The system and method of the invention can work down to resolution of several 100 of nm, affording thus a large improvement in comparison to synchrotron IR imaging that is the closest technique existing today. The advantage versus scanning probe approach is the absence of physical probe, thus suppressing confinement to surface information and removing uncertainty regarding the working behavior of the probe.