The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2018
Filed:
Aug. 24, 2012
Gary Durack, Urbana, IL (US);
Stephen D. Fleischer, Honolulu, HI (US);
Jeremy Hatcher, Urbana, IL (US);
David Roberts, Evans, GA (US);
Michael Zordan, Champaign, IL (US);
Gary Durack, Urbana, IL (US);
Stephen D. Fleischer, Honolulu, HI (US);
Jeremy Hatcher, Urbana, IL (US);
David Roberts, Evans, GA (US);
Michael Zordan, Champaign, IL (US);
Sony Corporation, Tokyo, JP;
Sony Corporation of America, New York, NY (US);
Abstract
Apparatus and methods for detecting, characterizing, and compensating motion-related error of moving micro-entities are described. Motion-related error may occur in streams of moving micro-entities, and may represent a deviation in and expected arrival time or an uncertainty in position of a micro-entity within the stream. Motion-related error of micro-entities is observed in a flow cytometer, e.g., as pulse jitter, and is found to have a functional dependence on a parameter of the system. The pulse jitter can be compensated, according to one embodiment, by adjusting data acquisition observation windows. For the flow cytometer, a reduction of pulse jitter can improve measurement accuracy, resolution of doublets, system throughput, and enable an increase in an interrogation region for probing the micro-entities.