The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2018
Filed:
Mar. 30, 2016
Applicant:
Infineon Technologies Ag, Neubiberg, DE;
Inventors:
Andreas Wiesbauer, Poertschach, AT;
Christian Ebner, Munich, DE;
Ernesto Romani, Munich, DE;
Stephan Mechnig, Munich, DE;
Joseph Hufschmitt, Munich, DE;
Christian Jenkner, Klagenfurt, AT;
Francesco Polo, Villach, AT;
Assignee:
INFINEON TECHNOLOGIES AG, Neubiberg, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 9/00 (2006.01); G01L 9/12 (2006.01);
U.S. Cl.
CPC ...
G01L 9/125 (2013.01); G01L 9/0072 (2013.01);
Abstract
A measurement method includes generating, by a sensor, a response signal in response to an excitation signal. The method also includes generating a sampling clock signal in accordance with a pseudo-random jitter, and sampling the response signal in accordance with the sampling clock signal to determine a plurality of digital samples. The method also includes combining the plurality of digital samples to form a measurement sample.