The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2018
Filed:
Oct. 21, 2015
The Charles Stark Draper Laboratory, Inc., Cambridge, MA (US);
David M. S. Johnson, Somerville, MA (US);
David L. Butts, Boston, MA (US);
Richard E. Stoner, Framingham, MA (US);
Tom Thorvaldsen, Hingham, MA (US);
THE CHARLES STARK DRAPER LABORATORY, INC., Cambridge, MA (US);
Abstract
An inertial measurement apparatus based on atom interferometry. In one example, the inertial measurement apparatus includes a vacuum chamber, first and second atom capture sites housed within the vacuum chamber, each of the first and second atom capture sites being selectively configured to trap and cool first and second atom samples of distinct atom species, an atom interferometry region disposed between the first and second atom capture sites, and first and second atom interferometers operating in the atom interferometry region, the first atom interferometer being configured to generate a first measurement corresponding to a common inertial input based on the first atom sample, and the second atom interferometer being configured to generate a second measurement corresponding to the same common inertial input based on the second atom sample.