The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2018
Filed:
Jan. 29, 2014
Hitachi, Ltd., Tokyo, JP;
Marie Tabaru, Tokyo, JP;
Hideki Yoshikawa, Tokyo, JP;
Rei Asami, Tokyo, JP;
Kunio Hashiba, Tokyo, JP;
Hiroshi Masuzawa, Tokyo, JP;
HITACHI, LTD., Tokyo, JP;
Abstract
There is provided an ultrasonic diagnostic apparatus capable of measuring hardness information of a subject with high time resolution and spatial resolution. The apparatus is provided with a ultrasonic probeand a displacement generation unitconfigured to displace an inside of a subject and is configured to transmit an ultrasonic beam for displacement detection to a plurality of detection positions of the subject from the ultrasonic probe, and to detect a shear wave velocity based on the displacement at the plurality of detection positions in a control unitby using a reflection signal detected in a detection unit, thereby outputting hardness information of the subject. The ultrasonic beam for displacement detection is transmitted to one of the plurality of detection positions. A waveform analysis unitof the control unitis configured to perform a change control of analyzing a shear wave resulting from the displacement to thus transmit the ultrasonic beam for displacement detection to another position of the plurality of detection positions. Thereby, it is possible to measure the shear wave velocity with high time resolution and spatial resolution, so that it is possible to obtain the hardness information of the subject with high precision.