The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 2018

Filed:

Aug. 06, 2014
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Hisashi Takahashi, Tokyo, JP;

Taiga Goto, Tokyo, JP;

Koichi Hirokawa, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
A61B 6/5258 (2013.01); A61B 6/032 (2013.01); A61B 6/542 (2013.01); A61B 6/5205 (2013.01); A61B 6/544 (2013.01);
Abstract

In order to provide a technique for reducing system noise from an output signal value (measurement data), an X-ray CT apparatus includes an X-ray generation unit that irradiates X-rays to an object, an X-ray detector that detects the X-rays transmitted through the object, a correction processing unit that corrects an output signal from the X-ray detector, and a reconstruction calculating unit that reconstructs an image on the basis of an output from the correction processing unit, in which the X-ray detector includes arranged detection elements, and in which the correction processing unit maintains an average value of output signal values of a plurality of predetermined detection elements centering on a focused detection element among the detection elements, and also reduces a variance of the output signal values of the plurality of predetermined detection elements centering on the focused detection element.


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