The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 2018

Filed:

Aug. 31, 2015
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Maxime Taron, Buc, FR;

Yves Lucien Trousset, Palaiseau, FR;

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); A61B 6/00 (2006.01); A61B 6/03 (2006.01); A61B 6/12 (2006.01); G06T 11/00 (2006.01); G06T 7/55 (2017.01); A61B 90/00 (2016.01);
U.S. Cl.
CPC ...
A61B 6/5235 (2013.01); A61B 6/03 (2013.01); A61B 6/12 (2013.01); A61B 6/4014 (2013.01); A61B 6/4441 (2013.01); A61B 6/463 (2013.01); A61B 6/466 (2013.01); A61B 6/467 (2013.01); A61B 6/488 (2013.01); G06T 7/55 (2017.01); G06T 11/005 (2013.01); A61B 6/465 (2013.01); A61B 6/487 (2013.01); A61B 6/505 (2013.01); A61B 6/5247 (2013.01); A61B 2090/376 (2016.02); G06T 2207/10121 (2013.01); G06T 2210/41 (2013.01);
Abstract

Systems and methods of object reconstruction from x-ray imaging include receiving an input of a first angulation for a first x-ray image. A first score representative of a quality of a reconstruction of an object from an x-ray image acquired at the first angulation is calculated. The first x-ray image is acquired at the first angulation. An input of a second angulation for a second x-ray image is received. A second score representative of the quality of the reconstruction of the object from the first x-ray image and an x-ray image acquired at the second angulation is calculated. The second x-ray image is acquired at the second angulation. The object is reconstructed from the first x-ray image and the second x-ray image.


Find Patent Forward Citations

Loading…