The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2018
Filed:
Jul. 24, 2014
Hitachi, Ltd., Tokyo, JP;
Hideaki Fujii, Tokyo, JP;
Tetsuo Nakazawa, Tokyo, JP;
HITACHI, LTD., Tokyo, JP;
Abstract
In an FFS method that improves spatial resolution by moving an X-ray focal spot to multiple positions to acquire projection data, in order to provide an X-ray CT apparatus and an image reconstruction method that enables to improve spatial resolution of the entire effective field of view without reducing a rotational speed, the X-ray focal spot in the X-ray tube deviceis shifted to acquire focal shift projection data (FFS projection data), the virtual view generation unitup-samples the FFS projection data (generates a virtual view) in the view direction, and the reconstruction computing unitreconstructs an image using actual data of the FFS projection data in the central regioncloser to the image center than a predetermined boundary and using the up-sampled projection data in the peripheral regionoutside the boundary in an image reconstruction computing process.