The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2018
Filed:
Dec. 04, 2014
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Inventors:
Sung Su Kim, Yongin-si, KR;
Hyun Hwa Oh, Hwaseong-si, KR;
Jae Hyun Kwon, Hwaseong-si, KR;
Young Hun Sung, Hwaseong-si, KR;
Kang Eui Lee, Seoul, KR;
Assignee:
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); G06T 5/00 (2006.01); G06T 5/40 (2006.01);
U.S. Cl.
CPC ...
A61B 6/5205 (2013.01); A61B 6/488 (2013.01); A61B 6/502 (2013.01); A61B 6/545 (2013.01); G06T 5/007 (2013.01); G06T 5/40 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/20104 (2013.01); G06T 2207/30068 (2013.01);
Abstract
A method and apparatus for generating an X-ray image are provided. The method includes obtaining an X-ray image of an object, performing image analysis on a tissue of interest in an area other than an interference target region in the obtained X-ray image, and performing image processing on an entirety of the obtained X-ray image based on information on the analyzed tissue of interest and generating a final X-ray image.