The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 2018

Filed:

Oct. 08, 2012
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventors:

Jakob Van De Laar, Oosterhout, NL;

Haris Duric, Bothell, WA (US);

Teun Van Den Heuvel, Waalre, NL;

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/11 (2006.01); A61B 5/0205 (2006.01); A61B 5/024 (2006.01); A61B 5/08 (2006.01);
U.S. Cl.
CPC ...
A61B 5/1118 (2013.01); A61B 5/0205 (2013.01); A61B 5/1116 (2013.01); A61B 5/1121 (2013.01); A61B 5/024 (2013.01); A61B 5/0816 (2013.01); A61B 2560/0223 (2013.01); A61B 2562/0219 (2013.01);
Abstract

A method of calibrating a monitoring device to be attached to a user is provided. Prior to attachment of the device, the device is aligned with respect to the user such that the measurement reference frame of the device is substantially aligned with a reference frame of the user. A first measurement of the orientation of the device with respect to a world reference frame is obtained. After attachment of the device, a second measurement of the orientation of the device with respect to a world reference frame is obtained. A transformation matrix is determined for use in transforming subsequent measurements obtained by the device into the reference frame of the user. The matrix is calculated using the first and second measurements and information on the amount of rotation of the device relative to the user about a vertical axis in the world reference frame between the first and second measurements being taken.


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