The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2018

Filed:

May. 28, 2015
Applicant:

Metabolon, Inc., Durham, NC (US);

Inventors:

Hongping Dai, Chapel Hill, NC (US);

Corey Donald DeHaven, Raleigh, NC (US);

Assignee:

METABOLON, INC., Durham, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 30/86 (2006.01); H01J 49/02 (2006.01); G06F 17/18 (2006.01); H01J 49/00 (2006.01); G01N 33/68 (2006.01); H01J 49/04 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0036 (2013.01); G01N 30/8634 (2013.01); G01N 30/8644 (2013.01); G01N 33/6848 (2013.01); H01J 49/04 (2013.01);
Abstract

A method, apparatus, and computer-readable storage medium for analyzing sample data from a component separation/mass spectrometer system. A profile plot is formed for each sample, each having retention time and intensity axes, the intensity being represented as a function of retention time for a selected sample ion mass. An intensity peak arrangement, including at least one identifying peak, each having a peak range and characteristic intensity, is identified for a selected ion in the profile plot for each sample. An orthogonal plot, corresponding to the profile plot, for each sample is formed, extending along the retention time axis perpendicularly to the intensity axis. The characteristic intensity of each of the at least one identifying peak is represented on the retention time axis of the orthogonal plot with gradated indicia.


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