The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2018
Filed:
Oct. 28, 2013
Applicant:
California Institute of Technology, Pasadena, CA (US);
Inventors:
Guoan Zheng, Vernon, CT (US);
Changhuei Yang, Alhambra, CA (US);
Roarke Horstmeyer, San Marino, CA (US);
Assignee:
California Institute of Technology, Pasadena, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G21K 7/00 (2006.01); G06K 9/00 (2006.01); G02B 21/36 (2006.01); G02B 27/58 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
G21K 7/00 (2013.01); G02B 21/365 (2013.01); G02B 21/367 (2013.01); G02B 27/58 (2013.01); G06K 9/00134 (2013.01); G02B 21/002 (2013.01);
Abstract
Methods, systems, and devices of Fourier ptychographic X-ray imaging by capturing a plurality of variably-illuminated, low-resolution intensity X-ray images of a specimen and computationally reconstructing a high-resolution X-ray image of the specimen by iteratively updating overlapping regions in Fourier space with the variably-illuminated, low-resolution intensity X-ray images.