The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2018
Filed:
Nov. 16, 2012
Omron Corporation, Kyoto-shi, Kyoto, JP;
Yasuyo Kotake, Kyoto, JP;
Yoshihisa Minato, Kyoto, JP;
Yukiko Yanagawa, Nara, JP;
Anh Nguyen, Kyoto, JP;
OMRON Corporation, Kyoto, JP;
Abstract
An image inspection method executed by an image inspection apparatus includes an acquisition step of acquiring an inspection target object image obtained by capturing an image of an inspection target object, a setting reading step of reading, from a storage device that stores inspection region defining information in advance, the inspection region defining information, an inspection region extraction step of extracting, as an inspection region image, a portion to be an inspection region from the inspection target object image, based on the inspection region defining information, and an inspection processing step of performing inspection on the inspection target object by analyzing the inspection region image. The inspection region defining information comprises information defining an initial contour of the inspection region and information defining a range based on the initial contour as a search range for searching a contour of the inspection region.